A team of researchers from ANSTO and University of Technology Sydney have set a record by conducting thin film experiments at 1,100 degrees Celsius, using the Spatz reflectometer equipped with a vacuum furnace.
The unique combination of neutron reflectometry with high temperature apparatus enables atomic-scale insights into thin film growth and diffusion processes. This is of relevance to a wide range of thin film technology and devices which undergo a range of processing and heat treatment conditions to optimize performance.
The UTS group, led by Francesca Iacopi and Aiswarya Pradeepkumar, has been studying the growth of thin carbon sheets (...
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