Defects in 2D Materials tagged posts

Method Detects Defects in 2D Materials for future Electronics, Sensors

A yellow laser beam shines on a chip and reveals a grain boundary defect
A laser beam (yellow) reflects off a 2D material (orange) highlighting a grain boundary defect in the atomic lattice.
 IMAGE: MRI/PENN STATE

To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2D materials.

Two-dimensional materials are atomically thin, the most well-known being graphene, a single-atom-thick layer of carbon atoms.

“People have struggled to make these 2D materials without defects,” said Mauricio Terrones, Verne M...

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