focused electron beam induced deposition (FEBID) tagged posts

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A new electron-beam (e-beam) technique adds carbon atoms to two-dimensional graphene, the equivalent of “writing” on the surface and controlling the electronic properties at the nanoscale. These electronic properties change over time, which could allow a device to function one way now and another way later – allowing the original information to “disappear.” The schematic shows the ability to draw an electron-rich carbon region (black rectangle labeled “FEBID Carbon”). Carbon deposition is induced near the e-beam and controlled by an electron dose. The atomic force microscopy image of the junction between the graphene domains shows an electron-rich, carbon-enhanced region (left) and electron-deficient region (right). Such a nanoscale junction between domains with different electronic properties could control how a device functions.

A new electron-beam (e-beam) technique adds carbon atoms to two-dimensional graphene, the equivalent of “writing” on the surface and controlling the electronic properties at the nanoscale. These electronic properties change over time, which could allow a device to function one way now and another way later – allowing the original information to “disappear.” The schematic shows the ability to draw an electron-rich carbon region (black rectangle labeled “FEBID Carbon”). Carbon deposition is induced near the e-beam and controlled by an electron dose. The atomic force microscopy image of the junction between the graphene domains shows an electron-rich, carbon-enhanced region (left) and electron-deficient region (right)...

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