IMAGE: MRI/PENN STATE
To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2D materials.
Two-dimensional materials are atomically thin, the most well-known being graphene, a single-atom-thick layer of carbon atoms.
“People have struggled to make these 2D materials without defects,” said Mauricio Terrones, Verne M...
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