reflectometry tagged posts

A Possible World Record: Studying Thin Films Under Extreme Temperatures with Reflectometry

A possible world record: Studying thin films under extreme temperatures with reflectometry
Schematic of the Ni/Cu catalytic alloy-mediated EG synthesis on 3C–SiC on silicon. Credit: RSC Advances (2024). DOI: 10.1039/D3RA08289J

A team of researchers from ANSTO and University of Technology Sydney have set a record by conducting thin film experiments at 1,100 degrees Celsius, using the Spatz reflectometer equipped with a vacuum furnace.

The unique combination of neutron reflectometry with high temperature apparatus enables atomic-scale insights into thin film growth and diffusion processes. This is of relevance to a wide range of thin film technology and devices which undergo a range of processing and heat treatment conditions to optimize performance.

The UTS group, led by Francesca Iacopi and Aiswarya Pradeepkumar, has been studying the growth of thin carbon sheets (...

Read More