scanning ultrafast electron microscope (SUEM) tagged posts

With scanning ultrafast electron microscopy, researchers unveil promising hot photocarrier transport properties of cubic boron arsenide. In a study that confirms its promise as the next-generation semiconductor material, UC Santa Barbara researchers have directly visualized the photocarrier transport properties of cubic boron arsenide single crystals.

“We were able to visualize how the charge moves in our sample,” said Bolin Liao, an assistant professor of mechanical engineering in the College of Engineeri...